Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
70 Patents
#57 in Kyoto 615-0031
#1,412 in Japan
#10,641 in the World
Nidec-Read Corporation
Forward Citations = 188
62 inventors:
Nidec-Read Corporation
% Expired Patents = 11.4
EPO Patents = 7
Forward Citations = 188
Loading Chart...
Loading Chart...
62 inventors (with patents filed for the assignee):
Norihiro Ota (15 out of 15 patents)
Munehiro Yamashita (8 out of 8 patents)
Michio Kaida (7 out of 7 patents)
4. Kohei Tsumura (6 out of 6 patents)
5. Hideo Nishikawa (6 out of 7 patents)
6. Masami Yamamoto (5 out of 5 patents)
7. Tatsufumi Kusuda (5 out of 34 patents)
8. Toshihide Matsukawa (5 out of 5 patents)
9. Yusuke Yokota (4 out of 4 patents)
10. Tadashi Takahashi (4 out of 4 patents)
11. Hidekazu Yamazaki (3 out of 3 patents)
12. Jun Kasai (3 out of 3 patents)
13. Yoshio Tsuji (3 out of 3 patents)
14. Takashi Isa (3 out of 3 patents)
15. Shigeki Sakai (2 out of 12 patents)
Core Competencies:
Inspection Jig
Circuit Board
Image Processing
Contact Terminal
Testing Apparatus
Flexible Circuit Board
Probe Device
Insulation Inspection
Wafer Flattening
Electric Conductivity
Coiled Electronic Component
Manufacturing Method
70 patents:
Company Overview
Nidec-Read Corporation, headquartered in Kyoto, Japan, specializes in the development and manufacturing of advanced inspection devices. The company focuses on technologies related to inspection jigs, circuit boards, and image processing, providing solutions for quality assurance in electronic components. Their expertise extends to testing apparatuses, flexible circuit boards, and probe devices, ensuring high standards in insulation inspection and overall product reliability. Nidec-Read plays a crucial role in enhancing manufacturing processes within the electronics industry.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Nidec-Read Corporation. Retrieved from https://idiyas.com/company/nidec-read
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
7 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]