This inventor holds 1 USPTO granted patent. Top assignees: Nidec Sv Probe Pte. Ltd., Nidec-Read Corporation. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 2 
1 out of 70 Years Active: 2021
Title: Akio Hayashi: Innovator in Probe Technology
Introduction
Akio Hayashi is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative designs and patents.
Latest Patents
Hayashi holds a patent for a probe, inspection jig, and inspection apparatus. The probe features a substantially bar-like shape, with a distal end portion that is columnar and designed to contact an inspection point on a device under test. The base end portion is also columnar, while the main body is formed in a flat ribbon shape connecting the two ends. Notably, the distal end surface is inclined and intersects with the axial center of the probe, enhancing its functionality.
Career Highlights
Throughout his career, Akio Hayashi has worked with prominent companies such as Nidec-Read Corporation and Nidec Sv Probe Pte. Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in inspection technology.
Collaborations
Hayashi has collaborated with notable colleagues, including Minoru Kato and Tadakazu Miyatake. Their combined expertise has fostered innovation in their respective fields.
Conclusion
Akio Hayashi's contributions to probe technology and inspection apparatuses highlight his role as a significant inventor in the industry. His innovative designs continue to influence the field and pave the way for future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile