Singapore, Singapore

Cheng Ghee Ong

This inventor holds 1 USPTO granted patent. Top assignees: Nidec Sv Probe Pte. Ltd., Nidec-Read Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cheng Ghee Ong. Retrieved from https://idiyas.com/inventor/cheng-ghee-ong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Cheng Ghee Ong: Innovator in Inspection Technology

Introduction

Cheng Ghee Ong is a notable inventor based in Singapore, recognized for his contributions to inspection technology. He holds a patent for a unique probe, inspection jig, and inspection apparatus that enhances the efficiency of device testing.

Latest Patents

Cheng Ghee Ong's patent, titled "Probe, inspection jig, and inspection apparatus," features a probe with a substantially bar-like shape. The design includes a distal end portion with a columnar shape that contacts an inspection point on a device under test. The base end portion mirrors this columnar shape, while the main body is formed in a flat ribbon shape connecting both ends. The distal end surface is inclined and intersects with the probe's axial center, optimizing its functionality. He has 1 patent to his name.

Career Highlights

Throughout his career, Cheng has worked with prominent companies such as Nidec-Read Corporation and Nidec Sv Probe Pte. Ltd. His experience in these organizations has contributed significantly to his expertise in inspection technologies.

Collaborations

Cheng Ghee Ong has collaborated with talented individuals in his field, including Matthias Joseph Chin Chieh Chia and Akio Hayashi. Their collective efforts have further advanced the innovations in inspection technology.

Conclusion

Cheng Ghee Ong's work exemplifies the spirit of innovation in the field of inspection technology. His patented designs and collaborations highlight his commitment to enhancing device testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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