This inventor holds 1 USPTO granted patent. Top assignees: Nidec Sv Probe Pte. Ltd., Nidec-Read Corporation. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 2 
1 out of 70 Years Active: 2021
Title: Raminderjit Singh: Innovator in Inspection Technology
Introduction
Raminderjit Singh is a notable inventor based in Singapore, recognized for his contributions to inspection technology. He holds a patent for a unique probe, inspection jig, and inspection apparatus that enhances the efficiency of device testing.
Latest Patents
His patent, titled "Probe, inspection jig, and inspection apparatus," features a probe with a substantially bar-like shape. The design includes a distal end portion with a columnar shape that contacts an inspection point on a device under test. The base end portion mirrors this columnar shape, while the main body is formed in a flat ribbon shape connecting both ends. The distal end surface is inclined and intersects with the probe's axial center, allowing for precise inspections.
Career Highlights
Raminderjit has worked with prominent companies such as Nidec-Read Corporation and Nidec Sv Probe Pte. Ltd. His experience in these organizations has contributed significantly to his expertise in the field of inspection technology.
Collaborations
Throughout his career, Raminderjit has collaborated with talented individuals, including Cheng Ghee Ong and Tadakazu Miyatake. These partnerships have fostered innovation and development in his projects.
Conclusion
Raminderjit Singh's innovative work in inspection technology, particularly his patented probe design, showcases his commitment to advancing device testing methods. His contributions continue to impact the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile