Mesa, AZ, United States of America

Jordan L Wahl

This inventor holds 1 USPTO granted patent. Top assignee: Nidec Sv Probe Pte. Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jordan L Wahl. Retrieved from https://idiyas.com/inventor/jordan-l-wahl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Jordan L Wahl: Innovator in Integrated Circuit Probes

Introduction

Jordan L Wahl is a notable inventor based in Mesa, AZ (US). He has made significant contributions to the field of integrated circuit technology. His innovative approach has led to the development of a unique patent that enhances the processing of circuit probes.

Latest Patents

Jordan L Wahl holds a patent for "Methods and systems for processing one or more integrated circuit probes." This invention features a probe sanding fixture that includes a base, a probe adapter with a probe guide defining channels, and a sander tool equipped with a sanding wheel and a gauge pin. The design allows for efficient processing of probes positioned in the channels, with the sander tool being translatable and rotatable for optimal functionality. He has 1 patent to his name.

Career Highlights

Jordan is currently employed at Nidec Sv Probe Pte. Ltd., where he continues to innovate in the field of integrated circuits. His work focuses on improving the efficiency and effectiveness of probe processing technologies.

Collaborations

Jordan collaborates with talented professionals in his field, including his coworker Son N Dang. Their combined expertise contributes to the advancement of technology in integrated circuits.

Conclusion

Jordan L Wahl is a dedicated inventor whose work in integrated circuit probes showcases his innovative spirit and commitment to technological advancement. His contributions are paving the way for future developments in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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