Trademarks = 2

Forward Citations = 183

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7 inventors (with patents filed for the assignee):

Tadashi Kitamura (4 out of 14 patents)

Masahiro Yamamoto (3 out of 39 patents)

Kazufumi Kubota (2 out of 7 patents)

4. Shinichi Nakazawa (2 out of 3 patents)

5. Neeti Vohra (2 out of 3 patents)

6. Masahiro Yamamoto (1 out of 45 patents)

7. Toshiaki Hasebe (1 out of 5 patents)

4 patents: Sort by Forward Citations

1. 7817844 - Pattern inspection apparatus and method (2010-10-19),

2. 7796801 - Pattern inspection apparatus and method (2010-09-14),

3. 7660455 - Pattern inspection apparatus, pattern inspection method, and recording medium (2010-02-09),

4. 6868175 - Pattern inspection apparatus, pattern inspection method, and recording medium (2005-03-15),

Nanogeometry Research Inc. is a leading research company specializing in the field of nanotechnology and nanomaterials. Our team of experts is dedicated to advancing the science of manipulating matter at the nanoscale to develop innovative solutions for a wide range of industries. From cutting-edge research to practical applications, we strive to stay at the forefront of nanotechnology innovation.

This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 9 2025

4 Patents

#2,786 in Tokyo

#7,416 in Japan

Tokyo, Japan

Nanogeometry Research Inc.