Tokyo, Japan

Shinichi Nakazawa

USPTO Granted Patents = 3 

Average Co-Inventor Count = 5.6

ph-index = 3

Forward Citations = 107(Granted Patents)


Location History:

  • Kawasaki, JP (2010)
  • Tokyo, JP (2010 - 2011)

Company Filing History:


Years Active: 2010-2011

Loading Chart...
3 patents (USPTO):Explore Patents

Title: Shinichi Nakazawa: Innovator in Pattern Inspection Technology

Introduction

Shinichi Nakazawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of pattern inspection technology, particularly in the semiconductor and liquid crystal display industries. With a total of 3 patents to his name, Nakazawa's work has been instrumental in advancing the precision and efficiency of pattern inspection processes.

Latest Patents

One of Nakazawa's latest patents is a pattern inspection apparatus and method designed for inspecting fine patterns, such as those found in semiconductor integrated circuits (LSI), liquid crystal panels, and photomasks. This innovative apparatus utilizes an image of the pattern to be inspected along with design data to ensure accuracy. The system includes a reference pattern generation device that creates a reference pattern from the design data, an image generation device for producing the image of the pattern, a detecting device for identifying the edges of the image, and an inspection device that compares these edges with the reference pattern. This comprehensive approach enhances the reliability of pattern inspections in high-tech manufacturing.

Career Highlights

Throughout his career, Nakazawa has worked with notable companies, including Nanogeometry Research Inc. and Ngr Limited. His experience in these organizations has allowed him to refine his expertise in pattern inspection technologies and contribute to various innovative projects.

Collaborations

Some of Nakazawa's coworkers include Tadashi Kitamura and Kazufumi Kubota. Their collaborative efforts have further enriched the development of advanced inspection technologies.

Conclusion

Shinichi Nakazawa's contributions to pattern inspection technology have had a lasting impact on the semiconductor and liquid crystal display industries. His innovative patents and collaborative work with esteemed colleagues highlight his dedication to advancing technology in this critical field.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…