Microinspection, Inc.

Calculating rank

USPTO Granted Patents = 7

% Expired Patents = 71.4

Forward Citations = 67

Loading Chart...

11 inventors (with patents filed for the assignee):

Tak Eun (7 out of 7 patents)

Dong Jun Lee (4 out of 61 patents)

Hee Dok Choi (2 out of 3 patents)

4. Seong Jin Kim (2 out of 77 patents)

5. Woo Chul Cho (1 out of 1 patent)

6. Sun-kyu Yang (1 out of 1 patent)

7. Jong In Park (1 out of 2 patents)

8. Dae Woong Song (1 out of 1 patent)

9. Beom Jin Kim (1 out of 1 patent)

10. Ho Hack Kim (1 out of 1 patent)

11. Jae Woo Lee (1 out of 29 patents)

7 patents: Sort by Forward Citations

1. 11624771 - Apparatus for inspecting illumination of lighting micro led (2023-04-11),

2. 8072600 - Inspection method of circuit substrate (2011-12-06),

3. 7746086 - Non-contact type apparatus for testing open and short circuits of a plurality of pattern electrodes formed on a panel (2010-06-29),

4. 7629796 - Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same (2009-12-08),

5. 7447784 - Authentication method using cellular phone in internet (2008-11-04),

6. 7104549 - Steerable inline skate (2006-09-12),

7. 6753684 - Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe (2004-06-22),

Company Overview

Microinspection, Inc. is a leading provider of advanced inspection solutions for semiconductor manufacturing and research industries. With a focus on high resolution imaging and precision measurement capabilities, our products help clients achieve optimal quality control and process efficiency. Visit our website for more information on our innovative technologies and services.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

7 Patents

#525 in Seoul

#1,435 in South Korea

Seoul, South Korea