The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6753684 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 22, 2004

Filed:

Apr. 29, 2002
Applicant:
Inventor:

Tak Eun, Ansan-shi, KR;

Assignee:

MicroInspection, Inc., Kyunggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/108 ; G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/108 ; G01R 3/102 ;
Abstract

An inspection apparatus and method of electrode patterns using rolling wire probes, which includes a rolling wire rotating for performing a rolling contact sliplessly across the electrode patterns, and a control unit for controlling operations of the inspection apparatus wholly and for discriminating the electrical characteristics according to the electrical signal sensed through the rolling wire provided to the rolling wire probe. The inspection method is used flexibly with electrode patterns having various forms regardless of the change of model or design of the product, unlike the inspection method of the conventional art by the test pin block. Upon inspecting a pixel portion of the electrode pattern, a scratch is not generated by the rolling contact operation, thereby increasing yield of the finished goods.


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