The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2023

Filed:

Mar. 09, 2022
Applicant:

Microinspection, Inc., Seoul, KR;

Inventors:

Tak Eun, Seoul, KR;

Ho Hack Kim, Seoul, KR;

Beom Jin Kim, Gyeonggi-do, KR;

Dong Jun Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 1/067 (2006.01); H01L 25/075 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2635 (2013.01); G01R 1/06783 (2013.01); H01L 25/0753 (2013.01);
Abstract

The present disclosure provides an apparatus for illumination inspection of micro LEDs. An apparatus for illumination inspection of micro LEDs includes a surface-contact probe making a surface contact, through an electrical resistive material, with a front surface of an LED assembly of multiple micro LEDs arranged forwardly and interconnecting LED electrodes at both ends of the micro LEDs, probe electrodes to be in line contact with one side and the other side of the surface-contact probe for supplying electric power, an imaging unit for photographing the LED assembly from an opposite surface of the surface-contact probe, to where the surface-contact probe is contacted, and a control unit for supplying electric power to the probe electrodes forwardly along the micro LEDs as aligned and for inspecting the micro LEDs illumination based on images of the LED assembly photographed by the imaging unit before and after supplying the electric power.


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