Beom Jin Kim

Title: Beom Jin Kim: Innovator in Micro LED Inspection Technology

Introduction

Beom Jin Kim is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of micro LED technology, particularly in the area of illumination inspection. His innovative approach has led to the development of a unique apparatus that enhances the efficiency and accuracy of micro LED inspections.

Latest Patents

Beom Jin Kim holds a patent for an "Apparatus for inspecting illumination of lighting micro LED." This invention provides a comprehensive solution for the illumination inspection of micro LEDs. The apparatus includes a surface-contact probe that makes contact with the front surface of an LED assembly, which consists of multiple micro LEDs. It features probe electrodes that supply electric power and an imaging unit that photographs the LED assembly. The control unit inspects the illumination of the micro LEDs based on the images captured before and after supplying electric power.

Career Highlights

Beom Jin Kim is currently employed at Microinspection, Inc., where he continues to develop innovative technologies in the field of micro LED inspection. His work has positioned him as a key player in advancing the capabilities of micro LED technology.

Collaborations

He collaborates with talented coworkers, including Tak Eun and Ho Hack Kim, who contribute to the innovative environment at Microinspection, Inc. Their combined expertise fosters a culture of creativity and technological advancement.

Conclusion

Beom Jin Kim's contributions to micro LED inspection technology exemplify the impact of innovation in the field. His patented apparatus represents a significant advancement in ensuring the quality and performance of micro LEDs.