This inventor holds 1 USPTO granted patent. Top assignee: Microinspection, Inc.. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: Woo Chul Cho: Innovator in Non-Contact Testing Technology
Introduction
Woo Chul Cho is a notable inventor based in Incheon, South Korea. He has made significant contributions to the field of testing technology, particularly with his innovative approach to non-contact testing methods. His work has implications for improving the efficiency and reliability of electronic testing processes.
Latest Patents
Woo Chul Cho holds a patent for a "Non-contact type apparatus for testing open and short circuits of a plurality of pattern electrodes formed on a panel." This invention discloses a non-contact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a non-contact type single side probe device, which includes an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested in one scanning process. This method prevents damage to the pattern electrodes due to contact failure or pressurized contact, thereby increasing the lifespan of the probe device compared to traditional contact type probe devices.
Career Highlights
Woo Chul Cho is associated with Microinspection, Inc., where he continues to develop and refine his innovative testing technologies. His work at the company has positioned him as a key figure in advancing non-contact testing methodologies.
Collaborations
Some of his coworkers include Tak Eun and Seong Jin Kim, who contribute to the collaborative environment at Microinspection, Inc. Their teamwork fosters innovation and enhances the development of cutting-edge technologies in the field.
Conclusion
Woo Chul Cho's contributions to non-contact testing technology exemplify the importance of innovation in the electronics industry. His patent reflects a significant advancement that not only improves testing efficiency but also enhances the durability of testing equipment.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile