The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Jul. 12, 2007
Tak Eun, Gyeonggi-do, KR;
Seong Jin Kim, Seoul, KR;
Hee Dok Choi, Incheon, KR;
Dong Jun Lee, Seoul, KR;
Jong IN Park, Seoul, KR;
Woo Chul Cho, Incheon, KR;
Tak Eun, Gyeonggi-do, KR;
Seong Jin Kim, Seoul, KR;
Hee Dok Choi, Incheon, KR;
Dong Jun Lee, Seoul, KR;
Jong In Park, Seoul, KR;
Woo Chul Cho, Incheon, KR;
Microinspection, Inc., Seoul, KR;
Abstract
Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.