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Yokohama, Japan

Lasertec Gmbh

USPTO Granted Patents = 58

% Expired Patents = 20.7

Trademarks = 12

Forward Citations = 262

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59 inventors (with patents filed for the assignee):

Haruhiko Kusunose (25 out of 25 patents)

Kiwamu Takehisa (9 out of 21 patents)

Jun Sakuma (7 out of 7 patents)

4. Hiroki Miyai (5 out of 6 patents)

5. Ko Gondaira (4 out of 4 patents)

6. Tsunehito Kohyama (4 out of 4 patents)

7. Hideo Takizawa (4 out of 4 patents)

8. Martin Reisacher (3 out of 14 patents)

9. Hirokazu Seki (3 out of 12 patents)

10. Peter Hildebrand (3 out of 16 patents)

11. Makoto Yonezawa (3 out of 6 patents)

12. Yoshihiro Nishimura (3 out of 3 patents)

13. Michael Kuhl (3 out of 10 patents)

14. Peter Wrba (3 out of 4 patents)

15. Shota Fujiki (3 out of 3 patents)

Core Competencies:

EUV Mask Inspection

Image Processing

Light Source Apparatus

Measurement Apparatus

Confocal Microscope

Defect Inspection

Optical Device

Phase Shift Measurement

Substrate Inspection

Laser Processing

Photomask Inspection

Optically Scanning

58 patents: Sort by Forward Citations

1. 12693232 - Light source apparatus, inspection apparatus, exposure apparatus, light source control method, inspection method, and exposure method (2026-07-28),

2. 12674760 - Optical apparatus and focus correction method (2026-07-07),

3. 12625381 - Illumination apparatus and illumination method (2026-05-12),

4. 12607838 - Calculation method, image-capturing method, and image-capturing apparatus (2026-04-21),

5. 12578281 - Defect inspection apparatus and defect inspection method (2026-03-17),

6. 12566142 - Optical apparatus and examination apparatus (2026-03-03),

7. 12504270 - Calculation method, image-capturing method, and image-capturing apparatus (2025-12-23),

8. 12361536 - EUV mask inspection device, EUV mask inspection method, non-transitory computer-readable medium storing EUV mask inspection program, and EUV mask inspection system including a gray image based on design data of a pattern (2025-07-15),

9. 12308600 - Light source apparatus and inspection apparatus (2025-05-20),

10. 12307736 - Image processing apparatus and image processing method (2025-05-20),

11. 12259339 - Light-source apparatus, inspection apparatus, and adjustment method (2025-03-25),

12. 12050184 - Mask inspection method and mask inspection apparatus (2024-07-30),

13. 11822233 - Image pickup apparatus and focus adjustment method using bending correction to adjust focusing (2023-11-21),

14. 11486693 - Measurement apparatus and measurement method (2022-11-01),

15. 11372222 - Confocal microscope and method for taking image using the same (2022-06-28),

Lasertec GmbH is a leading provider of high-precision laser systems and solutions for various industrial applications. With over 30 years of experience, Lasertec offers a wide range of laser technologies including laser marking, laser cutting, laser welding, and laser engraving. Our innovative solutions are trusted by customers worldwide and designed to meet the specific needs of industries such as automotive, electronics, medical, and aerospace. Visit our website to learn more about our advanced laser systems and the benefits they can bring to your manufacturing processes.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

58 Patents

#31 in Yokohama

#1,569 in Japan

#12,356 in the World

Yokohama, Japan

Lasertec Gmbh

Forward Citations = 262

59 inventors:

Haruhiko Kusunose (25 out of 25 patents)

Kiwamu Takehisa (9 out of 21 patents)

Jun Sakuma (7 out of 7 patents)

4. Hiroki Miyai (5 out of 6 patents)

5. Ko Gondaira (4 out of 4 patents)

Please report any incorrect information to [email protected]

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