The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Jul. 16, 2020
Applicant:

Lasertec Corporation, Kanagawa, JP;

Inventors:

Hiroki Miyai, Yokohama, JP;

Yoshito Fujiwara, Yokohama, JP;

Yoshihiro Kato, Yokohama, JP;

Assignee:

Lasertec Corporation, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/84 (2012.01); G03F 1/24 (2012.01); G03F 1/76 (2012.01); G03F 1/66 (2012.01); G03F 1/44 (2012.01); G03B 13/36 (2021.01);
U.S. Cl.
CPC ...
G03F 1/84 (2013.01); G03B 13/36 (2013.01); G03F 1/24 (2013.01); G03F 1/44 (2013.01); G03F 1/66 (2013.01); G03F 1/76 (2013.01);
Abstract

An image pickup apparatus includes a stage configured to support a sample at a plurality of support points, a bending data acquisition unit configured to acquire bending data corresponding to a bending of the sample supported on the stage, a height information detection unit configured to detect a height of the sample supported on the stage, a difference value calculation unit configured to calculate a difference value between a height indicated by height information and a height indicated by the bending data at each of a plurality of points on the sample, a correction data calculation unit configured to calculate correction data based on the difference value, and an estimation unit configured to calculate estimation data for estimating the height of the sample by correcting the bending data using the correction data.


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