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Trademarks = 2

Forward Citations = 25

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8 inventors (with patents filed for the assignee):

Charles A Taylor, Ii (6 out of 6 patents)

Darryl Barlett (6 out of 6 patents)

Roy Clarke (3 out of 12 patents)

4. Douglas Perry (3 out of 3 patents)

5. Jason Williams (2 out of 2 patents)

6. Barry Dean Wissman (2 out of 16 patents)

7. Scott Hines (1 out of 1 patent)

8. Greg DeMaggio (1 out of 4 patents)

6 patents: Sort by Forward Citations

1. 9239265 - Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing (2016-01-19),

2. 9030652 - Non-contact, optical sensor for synchronizing to free rotating sample platens with asymmetry (2015-05-12),

3. 8786841 - Thin film temperature measurement using optical absorption edge wavelength (2014-07-22),

4. 8282273 - Blackbody fitting for temperature determination (2012-10-09),

5. 7837383 - Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing (2010-11-23),

6. 7391523 - Curvature/tilt metrology tool with closed loop feedback control (2008-06-24),

K-space Associates, Inc. is a leading provider of advanced metrology instruments for research and production facilities. With over 20 years of experience, the company specializes in non-destructive testing solutions that enable precise measurements of thin films, semiconductors, and other materials. Their innovative products are designed to improve the efficiency and accuracy of processes in the semiconductor, optics, and solar industries.

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Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

6 Patents

#8 in Dexter, MI

#1,501 in Michigan

#43,803 in US

Dexter, MI, United States of America

K-space Associates, Inc.