The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2008

Filed:

Jun. 01, 2004
Applicants:

Charles A. Taylor, Ii, Ann Arbor, MI (US);

Darryl Barlett, Dexter, MI (US);

Douglas Perry, Chelsea, MI (US);

Roy Clarke, Ann Arbor, MI (US);

Inventors:

Charles A. Taylor, II, Ann Arbor, MI (US);

Darryl Barlett, Dexter, MI (US);

Douglas Perry, Chelsea, MI (US);

Roy Clarke, Ann Arbor, MI (US);

Assignee:

k-Space Associates, Inc., Ann Arbor, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus for quantitatively measuring the curvature and/or relative tilt of large surfaces wherein a small array of parallel laser beams, each separated by a known distance, reflect from the surface of a sample and fall upon a feedback controlled front-surface steering mirror to a detector that measures both the change in separation of the reflected beams and the spatial translation of the entire array on the detector. The sample surface is translated beneath or in front of the fixed laser array by means of a computer controlled stage or other apparatus to create a 1-dimensional line scan or 2-dimensional map of both bow and relative tilt of the sample surface. A computer-driven, feedback-controlled steering mirror compensates for varying sample tilt by precisely realigning the reflected laser array onto the detector as the sample is translated. The apparatus also utilizes a laser with intensity feedback control to continuously optimize the reflected laser power for varying surface reflectivity as the sample is translated. This combination provides a means to quantitatively measure curvature and relative tilt of sample areas much larger than the actual laser beam array size.


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