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Houston, TX, United States of America

Ionwerks, Inc.

USPTO Granted Patents = 40

EPO Patents = 7

Forward Citations = 613

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31 inventors (with patents filed for the assignee):

J Albert Schultz (33 out of 35 patents)

Thomas F Egan (28 out of 49 patents)

Marc Gonin (15 out of 17 patents)

4. Michael V Ugarov (13 out of 13 patents)

5. Katrin Fuhrer (13 out of 13 patents)

6. Steven Ulrich (12 out of 12 patents)

7. Kelley L Waters (10 out of 10 patents)

8. Agnès Tempez (9 out of 9 patents)

9. Ernest K Lewis (7 out of 7 patents)

10. Valeri V Raznikov (7 out of 7 patents)

11. Michael I McCully (7 out of 7 patents)

12. Valerie E Vaughn (6 out of 6 patents)

13. John Albert Schultz (4 out of 4 patents)

14. Vladislav V Zelenov (4 out of 5 patents)

15. David H Russell (4 out of 7 patents)

Core Competencies:

Nanoparticulate Imaging

Mass Spectrometry

Ion Mobility Spectrometry

Time-of-Flight Spectrometry

Multi-Beam Spectrometry

Dynamic Range Detection

Laser Desorption Profiling

Gas-Phase Purification

Biological Sample Analysis

MALDI Mass Spectrometry

Depth Profiling Techniques

Data Acquisition Systems

40 patents: Sort by Forward Citations

1. 11391681 - Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry (2022-07-19),

2. 10876982 - Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry (2020-12-29),

3. 10446383 - Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry (2019-10-15),

4. 10191028 - Inorganic nanoparticle matrices for sample analysis (2019-01-29),

5. 9297761 - Nanoparticulate assisted nanoscale molecular imaging by mass spectrometery (2016-03-29),

6. 8829428 - Time-of-flight spectrometry and spectroscopy of surfaces (2014-09-09),

7. 8614416 - Nonoparticulate assisted nanoscale molecular imaging by mass spectrometery (2013-12-24),

8. 8558168 - Post-ionization of neutrals for ion mobility oTOFMS identification of molecules and elements desorbed from surfaces (2013-10-15),

9. 8519329 - Time-of-flight mass spectrometry of surfaces (2013-08-27),

10. 8492710 - Fast time-of-flight mass spectrometer with improved data acquisition system (2013-07-23),

11. 8384023 - Post-ionization of neutrals for ion mobility oTOFMS identification of molecules and elements desorbed from surfaces (2013-02-26),

12. 8129675 - Neutral/ion reactor in adiabatic supersonic gas flow for ion mobility time-of-flight mass spectrometry (2012-03-06),

13. 8115167 - Multi-beam ion mobility time-of-flight mass spectrometry with multi-channel data recording (2012-02-14),

14. 8101909 - Time-of-flight mass spectrometry of surfaces (2012-01-24),

15. 7800054 - Fast time-of-flight mass spectrometer with improved dynamic range (2010-09-21),

Ionwerks, Inc. is a cutting-edge technology company specializing in the development and manufacturing of advanced ion beam systems. With a strong focus on research and innovation, we deliver highly precise and efficient solutions for various industries including semiconductor, nanotechnology, and materials science. Our state-of-the-art ion beam technology is designed to enable the fabrication, modification, and analysis of materials at the atomic level, opening up new possibilities for scientific research, device manufacturing, and product development. Visit our website to explore our wide range of ion beam systems and services.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 16 2025

40 Patents

#137 in Houston, TX

#478 in Texas

#8,345 in US

#16,557 in the World

Houston, TX, United States of America

Ionwerks, Inc.

Forward Citations = 613

31 inventors:

J Albert Schultz (33 out of 35 patents)

Thomas F Egan (28 out of 49 patents)

Marc Gonin (15 out of 17 patents)

4. Michael V Ugarov (13 out of 13 patents)

5. Katrin Fuhrer (13 out of 13 patents)

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