The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2013
Filed:
Jun. 08, 2011
Applicants:
J. Albert Schultz, Houston, TX (US);
Thomas F. Egan, Houston, TX (US);
Ernest K. Lewis, Pearland, TX (US);
Steven Ulrich, Houston, TX (US);
Kelley L. Waters, Houston, TX (US);
Inventors:
J. Albert Schultz, Houston, TX (US);
Thomas F. Egan, Houston, TX (US);
Ernest K. Lewis, Pearland, TX (US);
Steven Ulrich, Houston, TX (US);
Kelley L. Waters, Houston, TX (US);
Assignee:
Ionwerks, Inc., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/26 (2006.01); H01J 37/26 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.