Thomas F Egan

Title: Thomas F Egan: A Pioneer in Mass Spectrometry Innovations

Introduction

Thomas F Egan, based in Houston, Texas, is a prominent inventor with an impressive portfolio of 28 patents. His contributions primarily focus on the field of mass spectrometry, particularly in advancing techniques for molecular imaging at the nanoscale.

Latest Patents

Egan's cutting-edge patents include "Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry," which describes methods and devices that utilize nanoparticulate implantation as a matrix for secondary ions and particles. This innovation showcases the application of a photon beam source or a nanoparticulate beam source as a desorption or primary ion/primary particle source. His work significantly enhances the capabilities of mass spectrometry, pushing the boundaries of molecular imaging.

Career Highlights

Throughout his career, Thomas F Egan has made substantial contributions while working with renowned organizations such as Ionwerks, Inc. and The Texas A&M University System. His expertise in mass spectrometry and nanoparticulate technologies positions him as a leading figure in his field.

Collaborations

Egan has collaborated with notable professionals such as J Albert Schultz and Steven Ulrich, contributing to the development of innovative methods and applications in mass spectrometry. These collaborations have helped foster advancements in research and technology.

Conclusion

Thomas F Egan's expertise and innovative spirit have established him as a key inventor in the realm of mass spectrometry. With his extensive portfolio of patents and collaborations with esteemed colleagues, Egan continues to influence the scientific community, paving the way for future advancements in nanoscale imaging and analysis.