The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Nov. 30, 2010
Applicants:
J. Albert Schultz, Houston, TX (US);
Thomas F. Egan, Houston, TX (US);
Steven Ulrich, Houston, TX (US);
Kelley L. Waters, Houston, TX (US);
Inventors:
J. Albert Schultz, Houston, TX (US);
Thomas F. Egan, Houston, TX (US);
Steven Ulrich, Houston, TX (US);
Kelley L. Waters, Houston, TX (US);
Assignee:
Ionwerks, Inc., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/00 (2006.01); H01J 49/14 (2006.01); G01N 23/225 (2006.01);
U.S. Cl.
CPC ...
H01J 49/142 (2013.01); H01J 49/0095 (2013.01); H01J 49/0004 (2013.01); G01N 23/2258 (2013.01);
Abstract
Described is an analytical method and apparatus for counting and measuring the flight time of secondary electrons, secondary ions and neutrals, scattered ions and/or neutrals and for correlating coincidences between these while maintaining a continuous un-pulsed, micro-focused, primary particle beam for impinging a surface for purposes of microprobe imaging and microanalysis.