The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Apr. 25, 2008
Katrin Fuhrer, Bern, CH;
Marc Gonin, Bern, CH;
Thomas F. Egan, Houston, TX (US);
William Burton, Houston, TX (US);
J. Albert Schultz, Houston, TX (US);
Valerie E. Vaughn, Pearland, TX (US);
Steven R. Ulrich, Houston, TX (US);
Katrin Fuhrer, Bern, CH;
Marc Gonin, Bern, CH;
Thomas F. Egan, Houston, TX (US);
William Burton, Houston, TX (US);
J. Albert Schultz, Houston, TX (US);
Valerie E. Vaughn, Pearland, TX (US);
Steven R. Ulrich, Houston, TX (US);
Ionwerks, Inc., Houston, TX (US);
Abstract
Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.