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Phoenix, AZ, United States of America

Integrated Process Equipment Corporation

USPTO Granted Patents = 16

Forward Citations = 698

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24 inventors (with patents filed for the assignee):

John Andrew Adams (5 out of 49 patents)

Gerald A Krulik (5 out of 27 patents)

Sherman K Poultney (2 out of 20 patents)

4. Everett D Smith (2 out of 5 patents)

5. Paul J Clapis (2 out of 2 patents)

6. C Randall Harwood (2 out of 2 patents)

7. Chris E Barns (1 out of 39 patents)

8. Douglas P Kreager (1 out of 9 patents)

9. Stephen C Schultz (1 out of 22 patents)

10. George J Gardopee (1 out of 4 patents)

11. Fred E Mitchel (1 out of 3 patents)

12. Peter B Mumola (1 out of 9 patents)

13. Sanjeev R Chitre (1 out of 2 patents)

14. Takio Tamaki (1 out of 1 patent)

15. George N Steinberg (1 out of 9 patents)

16 patents: Sort by Forward Citations

1. 6132586 - Method and apparatus for non-contact metal plating of semiconductor (2000-10-17),

2. 6121152 - Method and apparatus for planarization of metallized semiconductor (2000-09-19),

3. 5885147 - Apparatus for conditioning polishing pads (1999-03-23),

4. 5870793 - Brush for scrubbing semiconductor wafers (1999-02-16),

5. 5855792 - Rinse water recycling method for semiconductor wafer processing equipment (1999-01-05),

6. 5851140 - Semiconductor wafer polishing apparatus with a flexible carrier plate (1998-12-22),

7. 5755614 - Rinse water recycling in CMP apparatus (1998-05-26),

8. 5664990 - Slurry recycling in CMP apparatus (1997-09-09),

9. 5643061 - Pneumatic polishing head for CMP apparatus (1997-07-01),

10. 5610102 - Method for co-registering semiconductor wafers undergoing work in one or (1997-03-11),

11. 5567255 - Solid annular gas discharge electrode (1996-10-22),

12. 5563709 - Apparatus for measuring, thinning and flattening silicon structures (1996-10-08),

13. 5555474 - Automatic rejection of diffraction effects in thin film metrology (1996-09-10),

14. 5555472 - Method and apparatus for measuring film thickness in multilayer thin (1996-09-10),

15. 5543919 - Apparatus and method for performing high spatial resolution thin film (1996-08-06),

Integrated Process Equipment Corporation (IPEC) is a leading manufacturer of industrial process equipment. With over 30 years of experience, IPEC offers a wide range of high-quality products for the pharmaceutical, biotechnology, and food industries. Their products include filtration systems, mixing tanks, and custom processing equipment designed to meet the unique needs of each customer. IPEC is committed to providing innovative solutions, exceptional customer service, and superior quality products.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

16 Patents

#56 in Phoenix, AZ

#240 in Arizona

#19,312 in US

#36,684 in the World

Phoenix, AZ, United States of America

Integrated Process Equipment Corporation

Forward Citations = 698

24 inventors:

John Andrew Adams (5 out of 49 patents)

Gerald A Krulik (5 out of 27 patents)

Sherman K Poultney (2 out of 20 patents)

4. Everett D Smith (2 out of 5 patents)

5. Paul J Clapis (2 out of 2 patents)

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