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Phoenix, AZ, United States of America

Integrated Process Equipment Corporation

USPTO Granted Patents = 16

Forward Citations = 701

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24 inventors (with patents filed for the assignee):

John Andrew Adams (5 out of 49 patents)

Gerald A Krulik (5 out of 27 patents)

Sherman K Poultney (2 out of 20 patents)

4. Everett D Smith (2 out of 5 patents)

5. Paul J Clapis (2 out of 2 patents)

6. C Randall Harwood (2 out of 2 patents)

7. Chris E Barns (1 out of 39 patents)

8. Douglas P Kreager (1 out of 9 patents)

9. Stephen C Schultz (1 out of 22 patents)

10. George J Gardopee (1 out of 4 patents)

11. Fred E Mitchel (1 out of 3 patents)

12. Peter B Mumola (1 out of 9 patents)

13. Sanjeev R Chitre (1 out of 2 patents)

14. Takio Tamaki (1 out of 1 patent)

15. George N Steinberg (1 out of 9 patents)

16 patents: Sort by Forward Citations

1. 6132586 - Method and apparatus for non-contact metal plating of semiconductor (2000-10-17),

2. 6121152 - Method and apparatus for planarization of metallized semiconductor (2000-09-19),

3. 5885147 - Apparatus for conditioning polishing pads (1999-03-23),

4. 5870793 - Brush for scrubbing semiconductor wafers (1999-02-16),

5. 5855792 - Rinse water recycling method for semiconductor wafer processing equipment (1999-01-05),

6. 5851140 - Semiconductor wafer polishing apparatus with a flexible carrier plate (1998-12-22),

7. 5755614 - Rinse water recycling in CMP apparatus (1998-05-26),

8. 5664990 - Slurry recycling in CMP apparatus (1997-09-09),

9. 5643061 - Pneumatic polishing head for CMP apparatus (1997-07-01),

10. 5610102 - Method for co-registering semiconductor wafers undergoing work in one or (1997-03-11),

11. 5567255 - Solid annular gas discharge electrode (1996-10-22),

12. 5563709 - Apparatus for measuring, thinning and flattening silicon structures (1996-10-08),

13. 5555474 - Automatic rejection of diffraction effects in thin film metrology (1996-09-10),

14. 5555472 - Method and apparatus for measuring film thickness in multilayer thin (1996-09-10),

15. 5543919 - Apparatus and method for performing high spatial resolution thin film (1996-08-06),

Integrated Process Equipment Corporation, based in Phoenix, AZ, specializes in the design and manufacturing of advanced process equipment for various industries. The company focuses on providing innovative solutions that enhance operational efficiency and product quality. With expertise in areas such as fluid handling, filtration, and separation technologies, Integrated Process Equipment Corporation serves a diverse clientele, contributing to sectors that require precision and reliability in their processes.

Profile summary based on public USPTO records.

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USPTO Data Jan 1 1976 - Sep 29 2026

16 Patents

#54 in Phoenix, AZ

#236 in Arizona

#19,898 in US

#37,766 in the World

Phoenix, AZ, United States of America

Integrated Process Equipment Corporation

Forward Citations = 701

24 inventors:

John Andrew Adams (5 out of 49 patents)

Gerald A Krulik (5 out of 27 patents)

Sherman K Poultney (2 out of 20 patents)

4. Everett D Smith (2 out of 5 patents)

5. Paul J Clapis (2 out of 2 patents)

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