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For the Inventor, By the Inventor

Tsukuba, Japan

High-reliability Engineering & Components Corporation


USPTO Granted Patents = 3


Forward Citations = 22

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7 inventors (with patents filed for the assignee):

goldMedal Satoshi Kuboyama (3 out of 8 patents)

silverMedal Akiko Makihara (3 out of 3 patents)

bronzeMedal Hiroyuki Shindou (2 out of 2 patents)

4.  Akifumi Maru (1 out of 1 patent)

5.  Tsukasa Ebihara (1 out of 1 patent)

6.  Yoshiya Ilde (1 out of 1 patent)

7.  Yoshiya Iide (1 out of 1 patent)

8.  Satoshi Tsukuba Space Center Kuboyama (0 patent)

9.  Hiroyuki c/o Tsukuba Space Center Japan Shindou (0 patent)

10.  Akiko High-Reliability Components Corp Makihara (0 patent)

11.  Yoshiya c/o Tsukuba Space Center Iide (0 patent)


3 patents:

1. 11115008 - Single event upset-tolerant latch circuit and flip-flop circuit (2021-09-07),
2. 7576583 - Single-event effect tolerant latch circuit and flip-flop circuit (2009-08-18),
3. 7504850 - Single-event-effect tolerant SOI-based inverter, NAND element, NOR element, semiconductor memory device and data latch circuit (2009-03-17),
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USPTO Data Jan 1 1976 - Dec 23 2025

3 Patents

#15 in Tsukuba

#8,769 in Japan

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Tsukuba, Japan

High-reliability Engineering & Components Corporation

Forward Citations = 22

7 inventors:

goldMedal Satoshi Kuboyama (3 out of 8 patents)

silverMedal Akiko Makihara (3 out of 3 patents)

bronzeMedal Hiroyuki Shindou (2 out of 2 patents)

4.  Akifumi Maru (1 out of 1 patent)

5.  Tsukasa Ebihara (1 out of 1 patent)

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