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EPO Patents = 1

Forward Citations = 42

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7 inventors (with patents filed for the assignee):

Mohamed M Hafed (7 out of 9 patents)

Bardia Pishdad (2 out of 2 patents)

Clarence K L Tam (2 out of 4 patents)

4. Geoffrey D Duerden (2 out of 2 patents)

5. Sébastien Laberge (2 out of 3 patents)

6. Gordon W Roberts (2 out of 17 patents)

7. Antonio H Chan (1 out of 2 patents)

7 patents: Sort by Forward Citations

1. 8327204 - High-speed transceiver tester incorporating jitter injection (2012-12-04),

2. 8244492 - Methods of parametric testing in digital circuits (2012-08-14),

3. 7917319 - Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits (2011-03-29),

4. 7813297 - High-speed signal testing system having oscilloscope functionality (2010-10-12),

5. 7681091 - Signal integrity measurement systems and methods using a predominantly digital time-base generator (2010-03-16),

6. 7315574 - System and method for generating a jittered test signal (2008-01-01),

7. 7242209 - System and method for testing integrated circuits (2007-07-10),

Dft Microsystems, Inc. is a leading provider of cutting-edge semiconductor testing solutions. With over a decade of experience in the industry, we offer innovative products and services to meet the ever-evolving demands of the market. Our team of experts is dedicated to delivering high-quality solutions that optimize testing processes and ensure superior performance. Visit our website to learn more about our comprehensive suite of offerings.

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USPTO Data Jan 1 1976 - Dec 30 2025

7 Patents

#57 in Burlington, MA

#2,243 in Massachusetts

#38,840 in US

Burlington, MA, United States of America

Dft Microsystems, Inc.