The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Jul. 12, 2007
Applicant:

Mohamed M. Hafed, Montreal, CA;

Inventor:

Mohamed M. Hafed, Montreal, CA;

Assignee:

DFT Microsystems, Inc., Burlington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 5/04 (2006.01); G06K 5/00 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Signal-integrity measurement systems and methods utilizing unique time-base generation techniques for controlling the sampling of one or more signals under test. A time-base generator made in accordance with the present disclosure includes a phase filter and modulation circuitry that generates a rapidly varying phase signal as a function of the output of a sigma-delta modulator. The phase filter filters unwanted high-frequency phase components from the rapidly varying phase signal. The filtered signal is used to clock one or more samplers so as to create sampling instances of the signal(s) under test. The sampling instances are then analyze using any one or more of a variety of techniques suited to the type of signal(s) under test.


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