The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Oct. 26, 2006
Mohamed M. Hafed, Montreal, CA;
Sebastien Laberge, Montreal, CA;
Bardia Pishdad, Montreal, CA;
Clarence K. L. Tam, Montreal, CA;
Mohamed M. Hafed, Montreal, CA;
Sebastien Laberge, Montreal, CA;
Bardia Pishdad, Montreal, CA;
Clarence K. L. Tam, Montreal, CA;
DFT Microsystems, Inc., Burlington, MA (US);
Abstract
A tester for testing high-speed serial transceiver circuitry. The tester includes a jitter generator that uses a rapidly varying phase-selecting signal to select between two or more differently phased clock signals to generate a phase-modulated signal. The phase-selecting signal is designed to contain low- and high-frequency components. The phase-modulated signal is input into a phase filter to filter unwanted high-frequency components. The filtered output of the phase filter is input into a data-transmit serializer to serialize a low-speed parallel word into a high-speed jittered test pattern for input into the transceiver circuitry.