Antonio H Chan

Title: Antonio H Chan: Innovator in Integrated Circuit Testing

Introduction

Antonio H Chan is a notable inventor based in Brossard, Canada. He has made significant contributions to the field of integrated circuit testing, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of testing systems used in electronic devices.

Latest Patents

One of Chan's latest patents is titled "System and method for testing integrated circuits." This invention features a module that contains an integrated testing system, which includes one or more measurement engines tightly coupled with a compute engine. The measurement engines consist of at least one stimulus instrument for exciting the circuitry of a device-under-test with various stimulus signals. Additionally, it includes at least one measurement instrument that measures the response of the device-under-test to these signals and generates measurement data. The compute engine is equipped with computation logic circuitry to determine whether the circuitry aboard the device-under-test passes or fails. Furthermore, the integrated testing system incorporates a communications engine that facilitates two-way communication between the automated testing equipment and a dedicated user interface on a host computer.

Another significant patent by Chan is the "Timing measurement device using a component-invariant vernier delay line." This invention addresses the challenges in improving the performance of timing and jitter measurement devices using Delay Locked Loop (DLL) and Vernier Delay Line (VDL) techniques. The component-invariant VDL technique allows for the measurement device to be synthesized from an RTL description, reducing the need for highly matched elements to minimize differential non-linearity timing errors. This innovation is based on a single-stage VDL structure that mimics the behavior of a complete VDL. Additionally, it provides a method and system that reduces test time during production testing, albeit at the expense of additional hardware.

Career Highlights

Antonio H Chan has worked with prestigious institutions such as McGill University and DFT Microsystems, Inc. His experience in these organizations has contributed to his expertise in integrated circuit testing and measurement technologies.

Collaborations

Throughout his career, Chan has collaborated with notable professionals in the field, including Gordon W Roberts and Geoffrey D Duerden. These collaborations have further enriched his work and innovations in integrated circuit testing.

Conclusion

Antonio H Chan is a distinguished inventor whose contributions to integrated circuit testing have made a significant impact in the field. His innovative patents reflect his commitment to advancing technology and