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For the Inventor, By the Inventor

Hayward, CA, United States of America

Cerprobe Corporation

USPTO Granted Patents = 13

Forward Citations = 777

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20 inventors (with patents filed for the assignee):

goldMedal Nasser Barabi (5 out of 36 patents)

silverMedal Siamak Jonaidi (3 out of 8 patents)

bronzeMedal H Dan Higgins (3 out of 6 patents)

4.  Scott R Williams (2 out of 2 patents)

5.  John W Tarzwell (2 out of 2 patents)

6.  R Dennis Bates (2 out of 2 patents)

7.  Martin A Martinez (1 out of 14 patents)

8.  Gerald Back (1 out of 6 patents)

9.  Son N Dang (1 out of 8 patents)

10.  Martin A Kurtz (1 out of 1 patent)

11.  Patrick James Tarzwell (1 out of 3 patents)

12.  Theodore R Myers (1 out of 1 patent)

13.  Barry M Hyland (1 out of 1 patent)

14.  Jack L Eddings (1 out of 1 patent)

15.  John C Dahl (1 out of 1 patent)


13 patents:

1. 6559665 - Test socket for an IC device (2003-05-06),
2. 6426637 - Alignment guide and signal transmission apparatus and method for spring contact probe needles (2002-07-30),
3. 6354859 - Cover assembly for an IC socket (2002-03-12),
4. 6297654 - Test socket and method for testing an IC device in a dead bug orientation (2001-10-02),
5. 6220870 - IC chip socket and method (2001-04-24),
6. 6208155 - Probe tip and method for making electrical contact with a solder ball contact of an integrated circuit device (2001-03-27),
7. 6114869 - Method and apparatus for interfacing between automatic wafer probe (2000-09-05),
8. 6002426 - Inverted alignment station and method for calibrating needles of probe (1999-12-14),
9. 5923178 - Probe assembly and method for switchable multi-DUT testing of integrated (1999-07-13),
10. 5828226 - Probe card assembly for high density integrated circuits (1998-10-27),
11. 5382898 - High density probe card for testing electrical circuits (1995-01-17),
12. 5066907 - Probe system for device and circuit testing (1991-11-19),
13. 4161692 - Probe device for integrated circuit wafers (1979-07-17),
Company Overview
Cerprobe Corporation, based in Hayward, California, specializes in advanced semiconductor test solutions. The company develops innovative technologies for the testing and characterization of integrated circuits, focusing on high-performance applications in various sectors, including telecommunications, automotive, and consumer electronics. Cerprobe's expertise lies in providing tailored solutions that enhance the efficiency and accuracy of semiconductor testing, contributing to the reliability of electronic devices in a rapidly evolving technological landscape.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

13 Patents

#48 in Hayward, CA

#5,661 in California

#23,854 in US

#45,081 in the World

Hayward, CA (US)
Hayward, CA, United States of America

Cerprobe Corporation

Forward Citations = 777

20 inventors:

goldMedal Nasser Barabi (5 out of 36 patents)

silverMedal Siamak Jonaidi (3 out of 8 patents)

bronzeMedal H Dan Higgins (3 out of 6 patents)

4.  Scott R Williams (2 out of 2 patents)

5.  John W Tarzwell (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Cerprobe Corporation. Retrieved from https://idiyas.com/company/cerprobe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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