For the Inventor, By the Inventor

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Hayward, CA, United States of America

Cerprobe Corporation

USPTO Granted Patents = 13

Forward Citations = 773

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20 inventors (with patents filed for the assignee):

Nasser Barabi (5 out of 36 patents)

Siamak Jonaidi (3 out of 8 patents)

H Dan Higgins (3 out of 6 patents)

4. Scott R Williams (2 out of 2 patents)

5. John W Tarzwell (2 out of 2 patents)

6. R Dennis Bates (2 out of 2 patents)

7. Martin A Martinez (1 out of 14 patents)

8. Gerald Back (1 out of 6 patents)

9. Son N Dang (1 out of 8 patents)

10. Martin A Kurtz (1 out of 1 patent)

11. Patrick James Tarzwell (1 out of 3 patents)

12. Theodore R Myers (1 out of 1 patent)

13. Barry M Hyland (1 out of 1 patent)

14. Jack L Eddings (1 out of 1 patent)

15. John C Dahl (1 out of 1 patent)

13 patents: Sort by Forward Citations

1. 6559665 - Test socket for an IC device (2003-05-06),

2. 6426637 - Alignment guide and signal transmission apparatus and method for spring contact probe needles (2002-07-30),

3. 6354859 - Cover assembly for an IC socket (2002-03-12),

4. 6297654 - Test socket and method for testing an IC device in a dead bug orientation (2001-10-02),

5. 6220870 - IC chip socket and method (2001-04-24),

6. 6208155 - Probe tip and method for making electrical contact with a solder ball contact of an integrated circuit device (2001-03-27),

7. 6114869 - Method and apparatus for interfacing between automatic wafer probe (2000-09-05),

8. 6002426 - Inverted alignment station and method for calibrating needles of probe (1999-12-14),

9. 5923178 - Probe assembly and method for switchable multi-DUT testing of integrated (1999-07-13),

10. 5828226 - Probe card assembly for high density integrated circuits (1998-10-27),

11. 5382898 - High density probe card for testing electrical circuits (1995-01-17),

12. 5066907 - Probe system for device and circuit testing (1991-11-19),

13. 4161692 - Probe device for integrated circuit wafers (1979-07-17),

Cerprobe Corporation is a leading provider of semiconductor testing equipment and services. With over 30 years of experience in the industry, we offer innovative solutions for testing and measuring semiconductor devices. Our state-of-the-art equipment and highly skilled team ensure the highest level of accuracy and reliability in semiconductor testing. Visit our website to learn more about our products and services.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

13 Patents

#47 in Hayward, CA

#5,483 in California

#23,123 in US

#43,687 in the World

Hayward, CA, United States of America

Cerprobe Corporation

Forward Citations = 773

20 inventors:

Nasser Barabi (5 out of 36 patents)

Siamak Jonaidi (3 out of 8 patents)

H Dan Higgins (3 out of 6 patents)

4. Scott R Williams (2 out of 2 patents)

5. John W Tarzwell (2 out of 2 patents)

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