Mesa, AZ, United States of America

John C Dahl


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Innovations by John C. Dahl

Introduction

John C. Dahl is a notable inventor based in Mesa, AZ (US). He has made significant contributions to the field of electrical engineering, particularly in the area of device and circuit testing. His innovative approach has led to the development of a unique probe system that enhances the efficiency of testing electrical circuits.

Latest Patents

John C. Dahl holds a patent for a "Probe system for device and circuit testing." This invention describes a probe assembly designed to provide temporary connections to electrical circuits under test, such as integrated circuits. The individual probes are crafted from suitable metal and feature a 90-degree bend, allowing for effective contact with circuit pads. The design includes a probe guide with a slot and hole to support and position the probe, ensuring accurate testing. An elastomeric pad and pressure plate work together to maintain contact with the circuit under test, facilitating signal communication from the probe tip to a remote location.

Career Highlights

Throughout his career, John C. Dahl has been associated with Cerprobe Corporation, where he has applied his expertise in electrical engineering to develop innovative testing solutions. His work has significantly impacted the efficiency and accuracy of circuit testing processes.

Collaborations

John C. Dahl has collaborated with notable colleagues, including John W. Tarzwell and Patrick James Tarzwell. These partnerships have fostered a creative environment that encourages innovation and the development of advanced testing technologies.

Conclusion

John C. Dahl's contributions to the field of electrical engineering, particularly through his patented probe system, demonstrate his commitment to innovation. His work continues to influence the industry, paving the way for more efficient testing methods in electrical circuits.

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