Company Filing History:
Years Active: 1998-1999
Title: R Dennis Bates: Innovator in Probe Technology
Introduction
R Dennis Bates is a notable inventor based in Gilbert, AZ (US), recognized for his contributions to probe technology in the semiconductor industry. With a total of 2 patents, Bates has developed innovative solutions that enhance the efficiency and reliability of integrated circuit testing.
Latest Patents
Bates' latest patents include a "Probe assembly and method for switchable multi-DUT testing of integrated circuits." This invention focuses on a system designed to test integrated circuits on semiconductor wafers, achieving low probe needle contact resistance with minimal force. The system employs a probe with multiple needles that are aligned with contact pads on the integrated circuit. The mechanical movement of the wafer allows for precise contact, ensuring reliable electrical connections.
Another significant patent is the "Probe card assembly for high density integrated circuits." This assembly features a probe card, interposer, and a probe array with closely spaced pins. Each pin is designed to contact integrated circuits effectively, with beams extending diagonally to accommodate grid contacts. This design enhances the performance of high-density integrated circuits.
Career Highlights
R Dennis Bates is currently associated with Cerprobe Corporation, where he applies his expertise in probe technology. His work has significantly impacted the field, leading to advancements in testing methodologies for integrated circuits.
Collaborations
Bates collaborates with talented professionals such as H Dan Higgins and Rajiv Pandey, contributing to innovative projects within the company.
Conclusion
R Dennis Bates stands out as a key figure in the development of advanced probe technologies, with his patents reflecting a commitment to improving semiconductor testing processes. His contributions continue to influence the industry positively.