For the Inventor, By the Inventor

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San Jose, CA, United States of America

Advantest Test Solutions, Inc.

USPTO Granted Patents = 35

Trademarks = 1

Forward Citations = 97

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38 inventors (with patents filed for the assignee):

Karthik Ranganathan (34 out of 35 patents)

Gregory Cruzan (32 out of 34 patents)

Samer Kabbani (28 out of 38 patents)

4. Paul Ferrari (23 out of 26 patents)

5. Gilberto Oseguera (17 out of 18 patents)

6. Mohammad Ghazvini (10 out of 10 patents)

7. Ira Leventhal (9 out of 25 patents)

8. Todd Berk (8 out of 11 patents)

9. Ikeda Hiroki (8 out of 8 patents)

10. Kiyokawa Toshiyuki (8 out of 8 patents)

11. Ian Williams (7 out of 7 patents)

12. Ikeda Hiroki (7 out of 7 patents)

13. Kiyokawa Toshiyuki (6 out of 6 patents)

14. Joe Koeth (4 out of 4 patents)

15. Martin Fischer (3 out of 39 patents)

Core Competencies:

Active Thermal Interposer

Thermal Array

Multi-Zone Control

Device Testing

High-Volume Testing

Socket Gimbal

Test System

Carrier-Based Delivery

Thermal Isolation

DUT Handling

Integrated Test Cell

Pop Structures

35 patents: Sort by Forward Citations

1. 12618896 - Active thermal interposer device with thermal isolation structures (2026-05-05),

2. 12613273 - Wafer scale active thermal interposer for device testing (2026-04-28),

3. 12540968 - Wafer scale active thermal interposer for device testing (2026-02-03),

4. 12540967 - Wafer scale active thermal interposer for device testing (2026-02-03),

5. 12535522 - Wafer scale active thermal interposer for device testing (2026-01-27),

6. 12411167 - Tension-based socket gimbal for engaging device under test with thermal array (2025-09-09),

7. 12374420 - Carrier based high volume system level testing of devices with pop structures (2025-07-29),

8. 12345756 - Integrated test cell using active thermal interposer (ATI) with parallel socket actuation (2025-07-01),

9. 12320852 - Passive carrier-based device delivery for slot-based high-volume semiconductor test system (2025-06-03),

10. 12320841 - Wafer scale active thermal interposer for device testing (2025-06-03),

11. 12235315 - Test system support component exchange system and method (2025-02-25),

12. 12235314 - Parallel test cell with self actuated sockets (2025-02-25),

13. 12216154 - Active thermal interposer device (2025-02-04),

14. 12210056 - Thermal array with gimbal features and enhanced thermal performance (2025-01-28),

15. 12203979 - Multi-input multi-zone thermal control for device testing (2025-01-21),

Company Overview

Advantest Test Solutions, Inc., based in San Jose, California, specializes in the development and manufacturing of advanced test and measurement equipment for the semiconductor industry. The company focuses on providing innovative solutions that enhance the efficiency and effectiveness of semiconductor testing processes. With a commitment to research and development, Advantest plays a crucial role in supporting the evolving needs of technology sectors, including automotive, telecommunications, and consumer electronics.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

35 Patents

#237 in San Jose, CA

#2,311 in California

#9,756 in US

#19,181 in the World

San Jose, CA, United States of America

Advantest Test Solutions, Inc.

Forward Citations = 97

38 inventors:

Karthik Ranganathan (34 out of 35 patents)

Gregory Cruzan (32 out of 34 patents)

Samer Kabbani (28 out of 38 patents)

4. Paul Ferrari (23 out of 26 patents)

5. Gilberto Oseguera (17 out of 18 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advantest Test Solutions, Inc.. Retrieved from https://idiyas.com/company/advantest-test-solutions

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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