For the Inventor, By the Inventor

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San Jose, CA, United States of America

Advantest Test Solutions, Inc.

USPTO Granted Patents = 30

Trademarks = 1

Forward Citations = 84

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35 inventors (with patents filed for the assignee):

Karthik Ranganathan (29 out of 30 patents)

Gregory Cruzan (27 out of 29 patents)

Samer Kabbani (23 out of 33 patents)

4. Paul Ferrari (18 out of 21 patents)

5. Gilberto Oseguera (17 out of 18 patents)

6. Ira Leventhal (9 out of 25 patents)

7. Mohammad Ghazvini (9 out of 9 patents)

8. Ikeda Hiroki (8 out of 8 patents)

9. Kiyokawa Toshiyuki (8 out of 8 patents)

10. Todd Berk (7 out of 10 patents)

11. Ian Williams (6 out of 6 patents)

12. Joe Koeth (4 out of 4 patents)

13. Martin Fischer (3 out of 34 patents)

14. Thomas Carleton Jones (3 out of 11 patents)

15. Toshiyuki Kiyokawa (3 out of 3 patents)

30 patents: Sort by Forward Citations

1. 12411167 - Tension-based socket gimbal for engaging device under test with thermal array (2025-09-09),

2. 12374420 - Carrier based high volume system level testing of devices with pop structures (2025-07-29),

3. 12345756 - Integrated test cell using active thermal interposer (ATI) with parallel socket actuation (2025-07-01),

4. 12320852 - Passive carrier-based device delivery for slot-based high-volume semiconductor test system (2025-06-03),

5. 12320841 - Wafer scale active thermal interposer for device testing (2025-06-03),

6. 12235315 - Test system support component exchange system and method (2025-02-25),

7. 12235314 - Parallel test cell with self actuated sockets (2025-02-25),

8. 12216154 - Active thermal interposer device (2025-02-04),

9. 12210056 - Thermal array with gimbal features and enhanced thermal performance (2025-01-28),

10. 12203979 - Multi-input multi-zone thermal control for device testing (2025-01-21),

11. 12203958 - Shielded socket and carrier for high-volume test of semiconductor devices (2025-01-21),

12. 12174248 - Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system (2024-12-24),

13. 11940487 - Thermal solution for massively parallel testing (2024-03-26),

14. 11852678 - Multi-input multi-zone thermal control for device testing (2023-12-26),

15. 11846669 - Active thermal interposer device (2023-12-19),

Advantest Test Solutions, Inc. is a leading provider of test equipment and solutions for the semiconductor industry. With a focus on innovation and quality, Advantest offers a wide range of products for testing and measuring semiconductor devices, including memory, logic, and system-on-chip devices. Their test solutions help semiconductor manufacturers improve the quality and reliability of their products, while also reducing time-to-market and overall production costs.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 23 2025

30 Patents

#244 in San Jose, CA

#2,590 in California

#10,860 in US

#21,192 in the World

San Jose, CA, United States of America

Advantest Test Solutions, Inc.

Forward Citations = 84

35 inventors:

Karthik Ranganathan (29 out of 30 patents)

Gregory Cruzan (27 out of 29 patents)

Samer Kabbani (23 out of 33 patents)

4. Paul Ferrari (18 out of 21 patents)

5. Gilberto Oseguera (17 out of 18 patents)

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