The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Jul. 29, 2022
Applicant:

Advantest Test Solutions, Inc., San Jose, CA (US);

Inventors:

Karthik Ranganathan, Foothill Ranch, CA (US);

Gilberto Oseguera, Corona, CA (US);

Gregory Cruzan, Anaheim, CA (US);

Joe Koeth, San Jose, CA (US);

Ikeda Hiroki, Kukishi Saitama, JP;

Kiyokawa Toshiyuki, Kukishi Saitama, JP;

Assignee:

Advantest Test Solutions, Inc, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 1/0441 (2013.01);
Abstract

An automated test equipment (ATE) includes a test interface board assembly. The test interface board includes a socket configured to provide electrical couplings from the test interface board to a device under test (DUT). The socket is further configured to accept an active thermal interposer (ATI) device while the DUT is disposed in the socket. The socket includes a plurality of spring-loaded roller retention devices configured to retain one or more devices in the socket. The ATE further includes a Z-axis interface plate configured to open the plurality of spring-loaded roller retention devices to enable insertion of the DUT into the socket and an ATI placement plate configured to open the plurality of spring-loaded roller retention devices to enable insertion of the ATI device into the socket.


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