The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2024
Filed:
Jun. 30, 2023
Intel Corporation, Santa Clara, CA (US);
Van H. Le, Portland, OR (US);
Abhishek A. Sharma, Hillsboro, OR (US);
Gilbert Dewey, Hillsboro, OR (US);
Kent Millard, Hillsboro, OR (US);
Jack Kavalieros, Portland, OR (US);
Shriram Shivaraman, Hillsboro, OR (US);
Tristan A. Tronic, Aloha, OR (US);
Sanaz Gardner, Portland, OR (US);
Justin R. Weber, Hillsboro, OR (US);
Tahir Ghani, Portland, OR (US);
Li Huey Tan, Hillsboro, OR (US);
Kevin Lin, Beaverton, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An integrated circuit includes: a gate dielectric; a first layer adjacent to the gate dielectric; a second layer adjacent to the first layer, the second layer comprising an amorphous material; a third layer adjacent to the second layer, the third layer comprising a crystalline material; and a source or drain at least partially adjacent to the third layer. In some cases, the crystalline material of the third layer is a first crystalline material, and the first layer comprises a second crystalline material, which may be the same as or different from the first crystalline material. In some cases, the gate dielectric includes a high-K dielectric material. In some cases, the gate dielectric, the first layer, the second layer, the third layer, and the source or drain are part of a back-gate transistor structure (e.g., back-gate TFT), which may be part of a memory structure (e.g., located within an interconnect structure).