The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Jul. 27, 2017
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Li-Hsien Huang, Hsinchu County, TW;

Chi-Hsi Wu, Hsinchu, TW;

Chen-Hua Yu, Hsinchu, TW;

Der-Chyang Yeh, Hsin-Chu, TW;

Hua-Wei Tseng, New Taipei, TW;

Ming-Chih Yew, Hsinchu, TW;

Yi-Jen Lai, Hsinchu, TW;

Ming-Shih Yeh, Hsinchu County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 25/10 (2006.01); H01L 23/00 (2006.01); H01L 23/544 (2006.01); H01L 25/00 (2006.01); H01L 21/56 (2006.01); H01L 21/48 (2006.01); H01L 25/065 (2006.01); H01L 21/683 (2006.01); H01L 23/31 (2006.01); H01L 23/50 (2006.01); H01L 23/538 (2006.01); H01L 23/498 (2006.01);
U.S. Cl.
CPC ...
H01L 25/105 (2013.01); H01L 21/4857 (2013.01); H01L 21/568 (2013.01); H01L 21/6835 (2013.01); H01L 23/544 (2013.01); H01L 24/20 (2013.01); H01L 25/0657 (2013.01); H01L 25/50 (2013.01); H01L 21/486 (2013.01); H01L 23/3128 (2013.01); H01L 23/49816 (2013.01); H01L 23/50 (2013.01); H01L 23/5389 (2013.01); H01L 2221/68345 (2013.01); H01L 2221/68359 (2013.01); H01L 2223/54426 (2013.01); H01L 2224/18 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48227 (2013.01); H01L 2225/06568 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/181 (2013.01);
Abstract

A semiconductor package includes a die, an insulation layer, a plurality of first electrical conductive vias, a plurality of second electrical conductive vias, a plurality of thermal conductive vias and a connecting pattern. The die includes a plurality of first pads and a plurality of second pads. The insulation layer is disposed on the die and includes a plurality of openings exposing the first pads and the second pads. The first electrical conductive vias and the second electrical conductive vias are disposed in the openings and contact the first pads and the second pads respectively. The thermal conductive vias are disposed on the insulation layer. The connecting pattern is disposed on the insulation layer and connects the first electrical conductive vias and the thermal conductive vias. The thermal conductive vias are connected to the first pads through the connecting pattern and the first electrical conductive vias.


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