Zhiming Jiang

Title: Zhiming Jiang: Innovator in Optical Metrology

Introduction

Zhiming Jiang is a prominent inventor based in Pleasanton, CA (US). He has made significant contributions to the field of optical metrology, holding a total of 4 patents. His work focuses on improving the accuracy and reliability of measurements in various applications.

Latest Patents

One of Jiang's latest patents is titled "Phase-resolved optical metrology for substrates." This invention provides methods and apparatus for determining the qualities of a substrate and films on it. By coupling transmitted and reflected signals using both amplitude and phase information, the metrology information obtained from film layers on the substrate is enhanced. Another notable patent is "Spectral matching based calibration." This patent presents methods and systems for calibrating system parameter values of a target inspection system. The Spectral Error Based Calibration (SEBC) minimizes differences in spectral error among different inspection systems for a given specimen, ensuring consistency and robustness in calibration.

Career Highlights

Throughout his career, Zhiming Jiang has worked with leading companies in the industry, including Kla Tencor Corporation and Applied Materials, Inc. His experience in these organizations has allowed him to develop and refine his innovative approaches to optical metrology.

Collaborations

Jiang has collaborated with notable professionals in his field, including Torsten Rudolf Kaack and Leonid Poslavsky. These collaborations have contributed to the advancement of technologies in optical measurement and calibration.

Conclusion

Zhiming Jiang's contributions to optical metrology through his patents and collaborations highlight his role as an influential inventor in the field. His work continues to impact the industry positively, paving the way for future innovations.