Shenzhen, China

Zheng-Cai She

USPTO Granted Patents = 5 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2014-2016

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5 patents (USPTO):Explore Patents

Title: Innovations of Zheng-Cai She

Introduction

Zheng-Cai She is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of image measurement and coordinate measuring technology. With a total of 5 patents, his work showcases a blend of creativity and technical expertise.

Latest Patents

One of his latest patents is a system and method for measuring images of objects. In this innovation, a computing device reads an entire image of an object, which is then spliced into multiple part images. Users can select an area on the entire image, and the computing device calculates the coordinate values of the selected area based on pixel points. This method enhances the precision of image measurement.

Another notable patent involves a computing device and method for determining ricochet vectors of a probe in a coordinate measuring machine (CMM). This method sets an approach distance between the probe and a manufactured object. It calculates the ricochet vector of the probe based on the position relation between the approach point and the measurement element of the manufactured object. This innovation improves the accuracy of measurements in manufacturing processes.

Career Highlights

Zheng-Cai She has worked with notable companies such as Hong-Fu Jin Precision Industry (Shenzhen) Co., Ltd. and Hon Hai Precision Industry Co., Ltd. His experience in these organizations has contributed to his development as an inventor and innovator in the field.

Collaborations

He has collaborated with esteemed colleagues, including Chih-Kuang Chang and Zhong-Kui Yuan. These partnerships have fostered a creative environment that has led to the development of his innovative patents.

Conclusion

Zheng-Cai She is a distinguished inventor whose work in image measurement and coordinate measuring technology has made a significant impact. His patents reflect his dedication to advancing technology and improving measurement accuracy in various applications.

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