The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Dec. 11, 2012
Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Chih-Kuang Chang, New Taipei, TW;
Zhong-Kui Yuan, Shenzhen, CN;
Zheng-Cai She, Shenzhen, CN;
Yu-Hua Xu, Shenzhen, CN;
Xiao-Guang Xue, Shenzhen, CN;
HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Shenzhen, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
In a method for determining ricochet vectors of a probe of a coordinate measuring machine (CMM) using a computing device, the computing device sets an approach distance between the probe and a manufactured object. Coordinates of a center of the probe and an initial vector of the probe for each measurement point of the manufactured object are obtained when the probe is manually operated to measure the manufactured object. A measurement element of the manufactured object is fit according to all measurement points of the manufactured object. For each measurement point, an approach point of the manufactured object is calculated, a position relation between the approach point and the measurement element of the manufactured object is determined, and a ricochet vector of the probe is calculated according to the position relation.