The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Sep. 27, 2011
Chih-kuang Chang, New Taipei, TW;
Zheng-cai She, Shenzhen, CN;
Zhong-kui Yuan, Shenzhen, CN;
LI Jiang, Shenzhen, CN;
Xiao-guang Xue, Shenzhen, CN;
Chih-Kuang Chang, New Taipei, TW;
Zheng-Cai She, Shenzhen, CN;
Zhong-Kui Yuan, Shenzhen, CN;
Li Jiang, Shenzhen, CN;
Xiao-Guang Xue, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A method controls probe measurement using an electronic device. The method receives user-defined identification data of a probe if a preset configuration file is not stored in a storage device of the electronic device, and fits a three dimensional (3D) model of the probe according to the user-defined identification data of the probe. The method further updates the user-defined identification data of the probe if the fitted 3D model does not match the probe, or stores the user-defined identification data of the probe in a user-defined configuration file if the fitted 3D model matches the probe, and controls the probe to execute measurement according to the user-defined configuration file.