The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Apr. 26, 2012
Chih-kuang Chang, New Taipei, TW;
Zheng-cai She, Shenzhen, CN;
Zhong-kui Yuan, Shenzhen, CN;
LI Jiang, Shenzhen, CN;
Yu-hua Xu, Shenzhen, CN;
Chih-Kuang Chang, New Taipei, TW;
Zheng-Cai She, Shenzhen, CN;
Zhong-Kui Yuan, Shenzhen, CN;
Li Jiang, Shenzhen, CN;
Yu-Hua Xu, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
In a method for regulating coordinates of a probe measurement system using an electronic device, the method determines a first center of a reference object using a probe measurement system, and a second center of the reference object using an image measurement system. The method further determines regulation values between the probe measurement system and the image measurement system by calculating difference values between coordinates of the first center and the second center of the reference object, and stores the regulation values in a storage device of the electronic device.