Hon Hai Precision Industry Co., Ltd.

Hong-Fu Jin Precision Industry (Shenzhen) Co., Ltd.

Zheng-Cai She

Chih-Kuang Chang

Zhong-Kui Yuan

Xiao-Guang Xue

Li Jiang

Zhi-Jun Zou

Yu-Hua Xu

Dong-Hai Li

A computing device reads an entire image of an object. The entire image is spliced by a plurality of part images. A user selects an area on the entire image. The computing device determines a first number of first pixel points between a center point of the selected area and a center point of each covered image. The converted images are part images that the selected area covers. The coordinate values of the center point of the selected area are calculated according to the first number of pixel points and a size of each pixel point of the entire image. The computing device calculates coordinate values of each point of a selected area according to the size of each pixel point and the coordinate values of the center point of the selected area.

System and method for measuring images of object

In a method for determining ricochet vectors of a probe of a coordinate measuring machine (CMM) using a computing device, the computing device sets an approach distance between the probe and a manufactured object. Coordinates of a center of the probe and an initial vector of the probe for each measurement point of the manufactured object are obtained when the probe is manually operated to measure the manufactured object. A measurement element of the manufactured object is fit according to all measurement points of the manufactured object. For each measurement point, an approach point of the manufactured object is calculated, a position relation between the approach point and the measurement element of the manufactured object is determined, and a ricochet vector of the probe is calculated according to the position relation.

Computing device and method for determining ricochet vectors of a probe of a coordinate measuring machine

In a method for calibrating a star probe of an image measuring machine, the star probe includes one or more probe heads. Probe configuration information for the star probe is configured when there is no probe configuration file of the star probe stored in a storage device of the image measuring machine, and one of the probe heads to be calibrated is selected from the star probe. The method calibrates a radius value of the selected probe head, and calibrates the deviation between the center point of the selected probe head and the focus of the camera lens. The method further generates a star probe model of the star probe according to the probe configuration information and the probe calibration information, and displays the star probe model of the star probe on a display device of the image measuring machine.

Computing device and method for calibrating star probe of image measuring machine

In a method for regulating coordinates of a probe measurement system using an electronic device, the method determines a first center of a reference object using a probe measurement system, and a second center of the reference object using an image measurement system. The method further determines regulation values between the probe measurement system and the image measurement system by calculating difference values between coordinates of the first center and the second center of the reference object, and stores the regulation values in a storage device of the electronic device.

Electronic device and method for regulating coordinates of probe measurement system

A method controls probe measurement using an electronic device. The method receives user-defined identification data of a probe if a preset configuration file is not stored in a storage device of the electronic device, and fits a three dimensional (3D) model of the probe according to the user-defined identification data of the probe. The method further updates the user-defined identification data of the probe if the fitted 3D model does not match the probe, or stores the user-defined identification data of the probe in a user-defined configuration file if the fitted 3D model matches the probe, and controls the probe to execute measurement according to the user-defined configuration file.

Growing community of inventors

Shenzhen, China

Zheng-Cai She