Changhua County, Taiwan

Zhe-Hui Lin


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 13(Granted Patents)


Location History:

  • Changhua County, TW (2013 - 2015)
  • Fuxing Township, TW (2015)

Company Filing History:


Years Active: 2013-2015

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5 patents (USPTO):Explore Patents

Title: Innovations of Zhe-Hui Lin

Introduction

Zhe-Hui Lin is a prominent inventor based in Changhua County, Taiwan. He has made significant contributions to the field of technology, particularly in the area of semiconductor devices. With a total of 5 patents to his name, Lin continues to push the boundaries of innovation.

Latest Patents

One of his latest patents is a testing and repairing apparatus of through silicon via in stacked-chip. This invention provides a method for testing and repairing a through silicon via (TSV) disposed between two chips. The apparatus includes various switches and control circuits that enhance the efficiency of the testing process.

Another notable patent involves a varactor that applies bias voltage to two through wafer vias to determine the capacitance of a depletion region capacitor formed between them. This invention utilizes a substrate with openings filled with conductive material to create through-wafer vias, allowing for precise measurement of capacitance based on applied bias voltage.

Career Highlights

Zhe-Hui Lin is currently affiliated with the Industrial Technology Research Institute, where he engages in cutting-edge research and development. His work focuses on advancing semiconductor technologies and improving the performance of electronic devices.

Collaborations

Lin collaborates with esteemed colleagues such as Chih-Sheng Lin and Hsin-Chi Lai, contributing to a dynamic research environment that fosters innovation and creativity.

Conclusion

Zhe-Hui Lin's contributions to the field of technology through his patents and collaborative efforts highlight his role as a key innovator in semiconductor research. His work continues to influence advancements in electronic devices and testing methodologies.

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