The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Dec. 15, 2011
Hsin-chi Lai, Taichung, TW;
Chih-sheng Lin, Tainan, TW;
Pi-feng Chiu, New Taipei, TW;
Zhe-hui Lin, Changhua County, TW;
Hsin-Chi Lai, Taichung, TW;
Chih-Sheng Lin, Tainan, TW;
Pi-Feng Chiu, New Taipei, TW;
Zhe-Hui Lin, Changhua County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A testing and repairing apparatus of through silicon via (TSV) disposed between a first and a second chips is provided. First terminals of a first and a second switches are coupled to a first terminal of the TSV. First terminals of a third and a fourth switches are coupled to a second terminal of the TSV. A first terminal of a first resister is coupled to a first voltage. A first selector is coupled between second terminals of the second switch and the first resister. A second selector is coupled between a second terminal of the fourth switch and a second voltage. A first control circuit detects the second terminal of the second switch, and controls the first switch, the second switch and the first selector. A second control circuit controls the third switch, the fourth switch and the second selector.