San Jose, CA, United States of America

Yung-Hung Wang

This inventor holds 20 USPTO granted patents and 4 published patent applications, primarily in Magnetic Sensors. Top assignees: Western Digital Technologies, Inc., Western Digital (Fremont), Inc.. Active years: 2018-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yung-Hung Wang. Retrieved from https://idiyas.com/inventor/yung-hung-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 20 

% Patents Active = 90.0

Average Co-Inventor Count = 6.2

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2018-2026

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Areas of Expertise:
Magnetic Recording
TMR Films
Dual Free Layers
Magnetic Sensor Array
Read Heads
Magnetoresistive Sensors
Exchange Bias Field
Capacitance
Chemical Mechanical Planarization
Bias Point Adjustment
Asymmetric Sensing
Corrosion Reduction
20 patents (USPTO):Explore Patents

Title: Inventor Yung-Hung Wang - Revolutionizing Technology

Introduction: Yung-Hung Wang is a visionary inventor based in San Jose, CA, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Yung-Hung Wang holds several patents in the areas of artificial intelligence, machine learning, and semiconductor technology, showcasing his expertise and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Yung-Hung Wang has worked with leading tech companies, spearheading projects that have pushed the boundaries of what is possible in the tech industry.

Collaborations: Throughout his career, Yung-Hung Wang has collaborated with top researchers, engineers, and scientists, fostering a culture of innovation and excellence in all his projects.

Conclusion: Yung-Hung Wang's relentless pursuit of innovation and his passion for pushing the limits of technology make him a true pioneer in the field, with a lasting impact on the industry as a whole.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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