Yokohama, Japan

Yukio Kenbo

This inventor holds 14 USPTO granted patents, primarily in Semiconductor Manufacturing. Top assignees: Hitachi, Ltd., Renesas Technology Corp.. Active years: 1985-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukio Kenbo. Retrieved from https://idiyas.com/inventor/yukio-kenbo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 57.1

Average Co-Inventor Count = 5.7

ph-index = 7

Forward Citations = 150(Granted Patents)


Location History:

  • Tokyo, JP (2002)
  • Yokohama, JP (1985 - 2009)

Company Filing History:


Years Active: 1985-2009

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Areas of Expertise:
Exposure Apparatus
Thin Film Measurement
Semiconductor Device
Chemical Mechanical Polishing
Wafer Transformation
Microscratch Detection
Integrated Circuit
Manufacturing Process
14 patents (USPTO):Explore Patents

Title: Yukio Kenbo - Innovative Inventor from Yokohama

Introduction: Yukio Kenbo is a renowned inventor hailing from Yokohama, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Yukio Kenbo holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach.

Career Highlights: With over two decades of experience in the industry, Yukio Kenbo has worked with leading research institutions and universities to develop cutting-edge solutions that have revolutionized the way we approach modern challenges.

Collaborations: Throughout his career, Yukio Kenbo has collaborated with top companies and fellow inventors to bring his ideas to life, fostering a culture of innovation and creativity in the process.

Conclusion: Yukio Kenbo's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology in Yokohama and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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