Company Filing History:
Years Active: 2014-2025
Title: Yuji Konyuba: Innovator in Electron Microscopy
Introduction
Yuji Konyuba is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electron microscopy, holding a total of 9 patents. His work focuses on enhancing the capabilities and efficiency of electron microscopes, which are essential tools in various scientific research fields.
Latest Patents
Konyuba's latest patents include an innovative electron microscope and a calibration method. This electron microscope features an electronic optical system that irradiates a specimen with an electron beam to form an image. It includes a camera with an image sensor that outputs a frame image, and a computation unit that generates an image based on this frame image. The computation unit sets a threshold to binarize the frame image and generates an image based on the binarized frame image. In the process of setting the threshold, the computation unit repeatedly establishes a tentative threshold, acquires multiple frame images under conditions where electrons entering the image sensor follow a Poisson process, and binarizes each of these images. It then integrates the binarized images to create a normalized constant based on the mean and variance of pixel values in the integrated image.
Another notable patent is a specimen pretreatment method. This method involves transferring a specimen supported by a first specimen supporting tool to a second specimen supporting tool. The process includes transferring the specimen to a film, immersing the film and specimen in a liquid to dissolve the film, and recovering the specimen from the liquid to support it with the second tool.
Career Highlights
Yuji Konyuba is currently employed at Jeol Ltd., a company renowned for its advanced electron microscopy technologies. His work at Jeol Ltd. has positioned him as a key player in the development of innovative microscopy solutions.
Collaborations
Konyuba has collaborated with notable colleagues, including Tomohiro Haruta and Tomohisa Fukuda. These collaborations have further enriched his research and development efforts in the field of electron microscopy.
Conclusion
Yuji Konyuba's contributions to electron microscopy through his patents and work at Jeol Ltd. highlight his role as a leading inventor in this critical area of scientific research. His innovative approaches continue to advance the capabilities of electron microscopy, benefiting researchers worldwide.