Nagano, Japan

Yuichi Matsuda

This inventor holds 20 USPTO granted patents, primarily in Semiconductor Packaging. Top assignees: Shinko Electric Industries Co., Ltd., Shinko Electronics Industries, Co., Ltd.. Active years: 2002-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuichi Matsuda. Retrieved from https://idiyas.com/inventor/yuichi-matsuda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 80.0

Average Co-Inventor Count = 3.8

ph-index = 6

Forward Citations = 197(Granted Patents)


Company Filing History:


Years Active: 2002-2016

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Areas of Expertise:
Probe Card
Wiring Substrate
Stacked Electronic Device
Semiconductor Package
Thermal Interface Material
Multilayered Substrate
Filamentous Conductors
Interconnection Substrate
Semiconductor Device
Manufacturing Method
20 patents (USPTO):Explore Patents

Title: Yuichi Matsuda: Innovator from Nagano with Pioneering Probe Card Technologies

Introduction

Yuichi Matsuda is an accomplished inventor based in Nagano, Japan, known for his significant contributions to the field of probe card technology. With a remarkable portfolio of 20 patents, Matsuda has established himself as a key player in the industry, driving innovations that enhance testing efficiency and accuracy.

Latest Patents

Matsuda's latest inventions include two groundbreaking probe card designs. The first patent describes a probe card featuring a wiring substrate with an opening portion, a connection pad positioned around this opening, and a resin portion made of an elastic material. The contact terminal protrudes from the resin's lower face and is integrally formed with the wire that connects the contact terminal to the connection pad.

The second patent outlines a similar probe card with a wiring substrate that includes an opening portion, along with first and second connection pads positioned contrarily. This design incorporates a resin portion within the opening, housing two buried wires that lead to separate contact terminals. These terminals are aligned to ensure they make contact with electrode pads of a test object simultaneously, enhancing testing processes.

Career Highlights

Yuichi Matsuda has honed his expertise while working at notable companies, including Shinko Electric Industries Co., Ltd. and Shinko Electronics Industries Co., Ltd. His time at these organizations allowed him to develop and patent innovative solutions that significantly advance probe card functionality.

Collaborations

Throughout his career, Matsuda has collaborated with esteemed colleagues, including Michio Horiuchi and Yasue Tokutake. Their joint efforts have played a crucial role in the development of cutting-edge technologies in probe card design, enabling efficient and effective testing solutions.

Conclusion

Yuichi Matsuda continues to make strides in the field of probe card innovations. With his extensive patent portfolio and collaborative work ethic, Matsuda remains a pivotal figure in enhancing testing technologies, contributing to advancements that address the evolving needs of the semiconductor industry. His relentless pursuit of innovation solidifies his status as a leading inventor in Japan and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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