This inventor holds 5 USPTO granted patents. Top assignee: Asahi Glass Company, Limited. Active years: 2008-2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Tokyo, JP (2008)
- Yokohama, JP (2008 - 2010)
- Chiyoda-ku, JP (2009 - 2014)
Company Filing History:
Years Active: 2008-2014
Title: Innovations by Yoshiyuki Sonda
Introduction
Yoshiyuki Sonda is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of glass technology, holding a total of 5 patents. His work focuses on methods for inspecting the quality of glass plates and detecting defects in transparent materials.
Latest Patents
One of his latest patents is a method for inspecting the quality of glass plates. This invention provides a quality inspection method that predicts the shape of the glass based on three types of design shape data. It calculates virtual errors at four supporting points of the glass plate to determine the quality of the glass based on a comparison with design data. Another notable patent is a defect inspection method and apparatus for transparent plate-like members. This method detects bubbles, scratches, and foreign matter in transparent materials by capturing images of both the main and rear surfaces of the material. It determines the location of defects based on the contrast of the images obtained.
Career Highlights
Yoshiyuki Sonda is currently associated with Asahi Glass Company, Limited, where he continues to innovate in the field of glass technology. His expertise has led to advancements that enhance the quality and reliability of glass products.
Collaborations
He has collaborated with notable coworkers such as Kimiaki Oto and Munehisa Kato, contributing to various projects that aim to improve glass inspection methods.
Conclusion
Yoshiyuki Sonda's contributions to glass technology through his innovative patents have significantly impacted the industry. His work continues to pave the way for advancements in quality inspection and defect detection in transparent materials.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
