The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2010
Filed:
Jul. 16, 2008
Yoshiyuki Sonda, Yokohama, JP;
Yoshiyuki Sonda, Yokohama, JP;
Asahi Glass Company, Limited, Tokyo, JP;
Abstract
A defect inspection method for a transparent plate material for detecting a bubble, a scratch, a foreign matter, and another defect existing on or in the transparent plate material. The method includes capturing a first image of a main surface of the transparent plate material and capturing a second image of a rear surface of the transparent plate material. A defect candidate is searched for in each of the first and second images. Whether a real image or a virtual image was formed is determined, based on a contrast of an image of a defect candidate obtained by the search. Further, based on an appearance pattern of the real image or the virtual image, a determination is made as to whether the defect candidate is located on the main surface, inside, or on the rear surface of the transparent plate material.