The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2014
Filed:
Aug. 03, 2011
Yoshiyuki Sonda, Chiyoda-ku, JP;
Yoshiyuki Sonda, Chiyoda-ku, JP;
Asahi Glass Company, Limited, Tokyo, JP;
Abstract
The present invention provides a quality inspection method of a glass plate, which can predict the shape of the glass based on three types of design shape data C, Cand Cof a glass plate in a state that it is placed on a three-point supporting type actual measurement inspection stand and an actual measurement shape data Yof the glass plate. The virtual errors ΔCC−C, ΔC=C−Cand ΔYY−Cat four supporting points of the glass plate are calculated, the correction amount R=r(C−C) or the correction amount R=r(C−C) is subtracted from Y−Cto calculate a value corresponding to a difference Y−A between a shape data Yof the glass on a desired actual measurement inspection stand and a design data A on the desired actual measurement inspection stand, and from the value corresponding to a difference Y−A and a quality standard, the quality of the glass plate is judged.